Pin Probe
Contact Probes are wire probes with extremely small diameters, suitable for inspecting electronic components with narrow pitch electrodes. Their conductors use palladium alloys, copper-silver alloys, tungsten, rhenium tungsten, and beryllium copper.
Compared to spring-type or cantilever-type probes, these are probe pins with excellent support for narrow pitches and area arrays associated with higher integration.
Contact probes using palladium alloys for their conducting materials have also been newly added to our lineup.
- Continuity inspection of IC packaged boards
- Continuity inspection of narrow pitch pattern printed circuit boards
- Continuity inspection of liquid crystal panels
- Continuity inspection of various connectors
- Kelvin resistance measurement of multi-layer circuit boards (detection of pseudo-contact)
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